Search Results for: electron microscopy
CRESSINGTON SPUTTER COATER 208HR
Sputter Coater of Cressington, mainly the Cressington 208HR now offers real solutions to the problems encountered when coating as it minimizes the effects of grain size. The 208HR offers a full range of coating materials and gives unprecedented deposition conditions. To minimize charging effects the 208HR stage design and wide range of operating of the uniformity […]
CRESSINGTON 208 CARBON COATER
Carbon Coater of Cressington, particularly the Cressington 208 is by far the most advanced Carbon Coater with wide applications for TEM, SEM and microprobe techniques. It allows change between varieties of applications with optimized operation conditions. The Cressington 208 is designed as a modular system to adapt to the many different needs demanded techniques. The basic […]
CRESSINGTON 328 SPUTTER COATER
Sputter Coater using 328 Ultra High Resolution Sputter System has the improved resolution of FESEMs and TEMs which demands improved specimen preparation techniques and resolution coatings. The Sputter coater from Cressington is specifically designed for the needs of ultra high resolution FESEM or TEM imaging. For nonconductive samples, specimen preparation and coating is the key to […]
CRESSINGTON 108 CARBON COATER
Cressington Coater or Cressington 108 carbon coater uses a novel evaporation supply. It boasts of several advantages and user-friendly features such that the current and voltage are monitored by sensor wires in the head and the evaporation source is controlled as part of a feedback loop. Also, the supply gives the conventional rod fed source unusual […]
Advantages of sputter coating for the specimen
Sputter Coater is the best method for organizing non- conducting specimens for inspection in a scanning electron microscope (SEM). The manual sputter coater is an ideal and systematic system for sample coating. It comes with Au of non- conducting samples for “standard SEM imaging”. The economical desktop have provided the benefits that you can reap, which offers rapid pump […]
Applied Physics that cater your needs
Applied Physics Pte Ltd is committed in providing the highest quality that pertaining to the electron microscopy community. The team has a vast of both experience and knowledge in electron microscopy as well as microanalysis. We have always strived for its excellence in understanding customer’s plight and providing the best solutions for them. The electron microscope is an effective […]
Thickness Monitoring Module
The MTM-10 is a compact, low cost thickness monitor. Originally designed for electron microscopy applications, it is also suitable for multiple use in complex deposition systems. It stores parameters for two deposition materials. The MTM-20 version includes a presettable thickness control feature but only stores parameters for one material.
Consumables and Targets
Consumables for Electron Microscopy Applied Physics Pte Ltd is a distributor of Electron Microscopy Sciences (EMS). EMS has the most comprehensive catalog to source for electron microscopy, light microscopy and histology supplies, chemicals and equipment. EMS is committed in providing the highest quality products along with competitive pricing, prompt delivery and outstanding customer service. Please […]
EMI Cancellation Systems
Magnetic Field Compensation Stefan Mayer Instruments was founded in 1993 when it started to manufacture fluxgate magnetometer for scientific applications. One of the specific area of interest is in the magnetic field compensation with their MR3 system. The Magnetic Field Compensation MR3 system is a proven solution of problems related with magnetic field noises in […]
Cressington Coater
The Cressington company was originally formed in 1973 to offer a product design service in the field of high vacuum coating. In 1977 the company commenced manufacturing and marketing a range of products. These early coating products were designed to deposit ultra-thin layers for sample preparation in transmission electron microscopy (TEM). The compact electron beam (EB) evaporation sources, […]